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Defect characterization of electronic conducting pseudo-perovskite systems

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The goal of the investigation presented in this report is to study the inter-relationship between electrical conductivity, oxidation- reduction kinetics, defect structure, and composition of n- and p- type binary and ternary transition metal oxides. The experimental part of the investigation included specimen preparation, thermogravimetric measurements, X-ray diffraction, thermally stimulated current, oxygen diffusion, optical absorption, transmission electron microscopy, electrical conductivity, and Seebeck measurements. The systems studied or being studied are LaMnO{sub 3}-LaCrO{sub 3}-LaCoO{sub 3}, Y{sub 1-x}Ca{sub x}CrO{sub 3}, Sr-doped LaMnO{sub 3}, Y{sub 1-x}Ca{sub x}MnO{sub 3}, and Ba{sub 2}YCu{sub 3}O{sub 7-x}.

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Last Updated September 29, 2016, 15:58 (LMT)
Created September 29, 2016, 15:58 (LMT)
Citation Anderson, H.U.; Nasrallah, M.M.; Sparlin, D.M.; Parris, P.E. ---- Roy Long, Defect characterization of electronic conducting pseudo-perovskite systems, 2016-09-29, https://edx.netl.doe.gov/dataset/defect-characterization-of-electronic-conducting-pseudo-perovskite-systems
Netl Product yes
Poc Email Roy.long@netl.doe.gov
Point Of Contact Roy Long
Program Or Project KMD
Publication Date 1990-1-1